Wei Gao received his Bachelor of Precision Instrumentation from Shanghai Jiao Tong University, China, in 1986, followed by MSc and Ph. D from Tohoku University, Japan, in 1991 and 1994, respectively. He is currently a professor and the director of Research Center for Precision Nanosystems, Department of Finemechanics of Tohoku University. He has been working in the field of precision engineering, specialized in precision metrology and micro/nano-metrology. He has developed a number of surface form measurement systems as well as several sensor technologies for precision positioning. He is a fellow of CIRP, and a fellow of the International Society for Nanomanufacturing. He serves as the Chairman of The Scientific Technical Committee Precision Engineering and Metrology of CIRP. He is also a Vice President of the Japan Society for Precision Engineering (JSPE) in the Japanese academic year of 2015. He works in the editorial board of several international journals. He has authored and co-authored 190 peer review journal papers. he has also applied 50 patents (20 issued). He is the author of the book “Precision Nanometrology – Sensors and Measuring Systems for Nanomanufacturing” (Springer). He has won five Paper Awards from Japan Society for Precision Engineering (JSPE).
Current Research
• Precision measurement
• Nanometrology
• Optical sensors
• Interested topics
Multi-degree-of-freedom position measurement
• Multi-axis displacement and angle sensors
• On-machine and in-process metrology
2016 - Best Paper Award, The 5th International Conference on Nanomanufacturing (nanoMan 2016)
Editorships
Conference Organization
